Abstract
This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.
Original language | Undefined |
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Title of host publication | 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE |
Place of Publication | Piscataway |
Publisher | IEEE Computer Society Press |
Pages | 1-7 |
Number of pages | 7 |
ISBN (Print) | 978-1-4244-2395-8 |
DOIs | |
Publication status | Published - 18 Jun 2008 |
Event | 14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008 - Vancouver, Canada Duration: 18 Jun 2008 → 20 Jun 2008 Conference number: 14 |
Publication series
Name | |
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Publisher | IEEE Computer Society Press |
Number | 412 |
Workshop
Workshop | 14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008 |
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Abbreviated title | IMS3TW |
Country/Territory | Canada |
City | Vancouver |
Period | 18/06/08 → 20/06/08 |
Keywords
- EWI-14989
- METIS-255472
- IR-62721