Exploring dynamics of embedded ADC through adapted digital input stimuli

Xiaoqin Sheng, Hans G. Kerkhoff, A. Zjajo, G. Gronthoud

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)

    Abstract

    This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.
    Original languageUndefined
    Title of host publication14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE
    Place of PublicationPiscataway
    PublisherIEEE Computer Society Press
    Pages1-7
    Number of pages7
    ISBN (Print)978-1-4244-2395-8
    DOIs
    Publication statusPublished - 18 Jun 2008
    Event14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008 - Vancouver, Canada
    Duration: 18 Jun 200820 Jun 2008
    Conference number: 14

    Publication series

    Name
    PublisherIEEE Computer Society Press
    Number412

    Workshop

    Workshop14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008
    Abbreviated titleIMS3TW
    CountryCanada
    CityVancouver
    Period18/06/0820/06/08

    Keywords

    • EWI-14989
    • METIS-255472
    • IR-62721

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