Exploring dynamics of embedded ADC through adapted digital input stimuli

Xiaoqin Sheng; Hans G. Kerkhoff; A. Zjajo; G. Gronthoud

doi:10.1109/IMS3TW.2008.4581617

Exploring dynamics of embedded ADC through adapted digital input stimuli

Xiaoqin Sheng, Hans G. Kerkhoff, A. Zjajo, G. Gronthoud

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

1 Downloads (Pure)

Abstract

This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.

Original language	Undefined
Title of host publication	14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE
Place of Publication	Piscataway
Publisher	IEEE
Pages	1-7
Number of pages	7
ISBN (Print)	978-1-4244-2395-8
DOIs	https://doi.org/10.1109/IMS3TW.2008.4581617
Publication status	Published - 18 Jun 2008
Event	14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008 - Vancouver, Canada Duration: 18 Jun 2008 → 20 Jun 2008 Conference number: 14

Publication series

Name
Publisher	IEEE Computer Society Press
Number	412

Workshop

Workshop	14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008
Abbreviated title	IMS3TW
Country/Territory	Canada
City	Vancouver
Period	18/06/08 → 20/06/08

Keywords

EWI-14989
METIS-255472
IR-62721

Access to Document

10.1109/IMS3TW.2008.4581617

http://eprints.eemcs.utwente.nl/secure2/14989/01/IMS3TW_18-20_June_2008_pp_Xiaoqin.pdf

Cite this

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title = "Exploring dynamics of embedded ADC through adapted digital input stimuli",

abstract = "This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.",

keywords = "EWI-14989, METIS-255472, IR-62721",

author = "Xiaoqin Sheng and Kerkhoff, \{Hans G.\} and A. Zjajo and G. Gronthoud",

note = "10.1109/IMS3TW.2008.4581617 ; 14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008 ; Conference date: 18-06-2008 Through 20-06-2008",

year = "2008",

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doi = "10.1109/IMS3TW.2008.4581617",

language = "Undefined",

isbn = "978-1-4244-2395-8",

publisher = "IEEE",

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pages = "1--7",

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address = "United States",

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Sheng, X, Kerkhoff, HG, Zjajo, A & Gronthoud, G 2008, Exploring dynamics of embedded ADC through adapted digital input stimuli. in 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE., 10.1109/IMS3TW.2008.4581617, IEEE, Piscataway, pp. 1-7, 14th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop. IMS3TW 2008, Vancouver, Canada, 18/06/08. https://doi.org/10.1109/IMS3TW.2008.4581617

Exploring dynamics of embedded ADC through adapted digital input stimuli. / Sheng, Xiaoqin; Kerkhoff, Hans G.; Zjajo, A. et al.
14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE. Piscataway: IEEE, 2008. p. 1-7 10.1109/IMS3TW.2008.4581617.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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N2 - This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.

AB - This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.

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BT - 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE

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