Fingerprint
Dive into the research topics of 'Exploring Voltage Mediated Delamination of Suspended 2D Materials as a Cause of Commonly Observed Breakdown'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Exploring Voltage Mediated Delamination of Suspended 2D Materials as a Cause of Commonly Observed Breakdown
J. Loessberg-Zahl*, D.S. de Bruijn, W.T.E. van den Beld, E. Dollekamp, E. Grady, A. Keerthi, J. Bomer, B. Radha, H.J.W. Zandvliet, A.A. Bol, A. van den Berg, J.C.T. Eijkel
*Corresponding author for this work
Research output: Contribution to journal › Article › Academic › peer-review
2
Citations
(Scopus)
5
Downloads
(Pure)