Extracting surface charge and ion adsorption from AFM force measurement

Research output: Contribution to conferencePoster

Original languageEnglish
Pages-
Publication statusPublished - 2015
EventPhysics@FOM Veldhoven 2015 - NH Koningshof Veldhoven, Veldhoven, Netherlands
Duration: 20 Jan 201521 Jan 2015

Conference

ConferencePhysics@FOM Veldhoven 2015
CountryNetherlands
CityVeldhoven
Period20/01/1521/01/15

Keywords

  • METIS-312344

Cite this

Zhao, C., Ebeling, D., Sîretanu, I., van den Ende, H. T. M., & Mugele, F. G. (2015). Extracting surface charge and ion adsorption from AFM force measurement. -. Poster session presented at Physics@FOM Veldhoven 2015, Veldhoven, Netherlands.