Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Nebojša Nenadović*, Slobodan Mijalković, L. K. Nanver, Lode J.K. Vandamme, Hugo Schellevis, Vincenzo d'Alessandro, Jan W. Slotboom

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.

Original languageEnglish
Title of host publicationProceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003
Pages125-128
Number of pages4
Publication statusPublished - 1 Dec 2003
Externally publishedYes
Event2003 BIPOLAR/BICMOS Circuits and Technology Meeting - Toulouse, France
Duration: 28 Sep 200330 Sep 2003

Conference

Conference2003 BIPOLAR/BICMOS Circuits and Technology Meeting
CountryFrance
CityToulouse
Period28/09/0330/09/03

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