Abstract
Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.
Original language | English |
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Title of host publication | Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003 |
Pages | 125-128 |
Number of pages | 4 |
Publication status | Published - 1 Dec 2003 |
Externally published | Yes |
Event | 2003 BIPOLAR/BICMOS Circuits and Technology Meeting - Toulouse, France Duration: 28 Sep 2003 → 30 Sep 2003 |
Conference
Conference | 2003 BIPOLAR/BICMOS Circuits and Technology Meeting |
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Country/Territory | France |
City | Toulouse |
Period | 28/09/03 → 30/09/03 |