Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.
|Title of host publication||Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003|
|Number of pages||4|
|Publication status||Published - 1 Dec 2003|
|Event||2003 BIPOLAR/BICMOS Circuits and Technology Meeting - Toulouse, France|
Duration: 28 Sep 2003 → 30 Sep 2003
|Conference||2003 BIPOLAR/BICMOS Circuits and Technology Meeting|
|Period||28/09/03 → 30/09/03|