Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Nebojša Nenadović; Slobodan Mijalković; L. K. Nanver; Lode J.K. Vandamme; Hugo Schellevis; Vincenzo d'Alessandro; Jan W. Slotboom

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Nebojša Nenadović^*, Slobodan Mijalković, L. K. Nanver, Lode J.K. Vandamme, Hugo Schellevis, Vincenzo d'Alessandro, Jan W. Slotboom

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

Abstract

Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.

Original language	English
Title of host publication	Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003
Pages	125-128
Number of pages	4
Publication status	Published - 1 Dec 2003
Externally published	Yes
Event	2003 BIPOLAR/BICMOS Circuits and Technology Meeting - Toulouse, France Duration: 28 Sep 2003 → 30 Sep 2003

Conference

Conference	2003 BIPOLAR/BICMOS Circuits and Technology Meeting
Country/Territory	France
City	Toulouse
Period	28/09/03 → 30/09/03

Cite this

@inproceedings{cb30b273ea4e4c93b7c89c321846f04c,

title = "Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors",

abstract = "Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.",

author = "Neboj{\v s}a Nenadovi{\'c} and Slobodan Mijalkovi{\'c} and Nanver, {L. K.} and Vandamme, {Lode J.K.} and Hugo Schellevis and Vincenzo d'Alessandro and Slotboom, {Jan W.}",

year = "2003",

month = dec,

day = "1",

language = "English",

pages = "125--128",

booktitle = "Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003",

note = "2003 BIPOLAR/BICMOS Circuits and Technology Meeting ; Conference date: 28-09-2003 Through 30-09-2003",

}

Nenadović, N, Mijalković, S, Nanver, LK, Vandamme, LJK, Schellevis, H, d'Alessandro, V & Slotboom, JW 2003, Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors. in Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003. pp. 125-128, 2003 BIPOLAR/BICMOS Circuits and Technology Meeting, Toulouse, France, 28/09/03.

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors. / Nenadović, Nebojša; Mijalković, Slobodan; Nanver, L. K. et al.

Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003. 2003. p. 125-128.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

AU - Nenadović, Nebojša

AU - Mijalković, Slobodan

AU - Nanver, L. K.

AU - Vandamme, Lode J.K.

AU - Schellevis, Hugo

AU - d'Alessandro, Vincenzo

AU - Slotboom, Jan W.

PY - 2003/12/1

Y1 - 2003/12/1

N2 - Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.

AB - Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rational complex function.

UR - http://www.scopus.com/inward/record.url?scp=1042266047&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:1042266047

SP - 125

EP - 128

BT - Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003

T2 - 2003 BIPOLAR/BICMOS Circuits and Technology Meeting

Y2 - 28 September 2003 through 30 September 2003

ER -

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Abstract

Conference

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