Extreme Ultraviolet (EUV) induced defects on few-layer graphene

An Gao, P.J. Rizo, E. Zoethout, L. Scaccabarozzi, Christopher James Lee, V. Banine, Frederik Bijkerk

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)

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Physics & Astronomy