Fabrication and characterization of free-standing, high-line-density transmission gratings for the vacuum UV to soft X-ray range

S.J. Goh*, H.M.J. Bastiaens, B. Vratzov, Q. Huang, F. Bijkerk, K.J. Boller

*Corresponding author for this work

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Abstract

We present state-of-the-art high resolution transmission gratings, applicable for spectroscopy in the vacuum ultraviolet (VUV) and the soft X-ray (SRX) wavelength range, fabricated with a novel process using ultraviolet based nano imprint lithography (UV-NIL). Free-standing, high-line-density gratings with up to 10,000 lines per mm and various space-to-period ratios were fabricated. An optical characterization of the gratings was carried out in the range from 17 to 34 nm wavelength using high-harmonic generation in a capillary waveguide filled with Ne, and around 13.5 nm wavelength (from 10 to 17 nm) using a Xenon discharge plasma.
Original languageEnglish
Pages (from-to)4421-4434
Number of pages14
JournalOptics express
Volume23
Issue number4
DOIs
Publication statusPublished - 2015

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