45 degrees grain boundary junctions have been made using (100) MgO substrates, a CeO2 template layer and an YBa2Cu3O7 top layer. To minimize the damage to the MgO surface, which will occur if the CeO2 is structured using ion milling, the CeO2 layer has been structured using the CaO lift-off technique. Electrical measurements of these junctions as a function of temperature, microwave irradiation and magnetic field will be discussed in this paper.
|Publication status||Published - 1994|
|Event||20th International Conference on Low Temperature Physics, LT-20 1993 - Eugene, United States|
Duration: 4 Aug 1993 → 11 Aug 1993
Conference number: 20