Abstract
We have used scanning tunneling microscopy to study the faceting of <010> oriented steps on Si(001) and Ge(001) surfaces. The <010> oriented steps on Si(001) tend to facet into local SA and SB step segments, whereas <010> oriented steps on Ge(001) meander along the mean <010> direction. We show that the step faceting behavior of the Si and Ge(001) surfaces is fully governed by the next-nearest-neighbor (NNN) interaction between the substrate dimers. Only in the case of a repulsive NNN interaction, as for Si(001), faceting occurs.
Original language | Undefined |
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Pages (from-to) | 125311- |
Number of pages | 4 |
Journal | Physical review B: Condensed matter and materials physics |
Volume | 69 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2004 |
Keywords
- IR-48890
- METIS-220679