Facing drift: A comparison of three methods

Michael J.A.M. Van Putten*, Maurice H.P.M. Van Putten

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Abstract

Drift is a common phenomenon in active sensors and, if left untreated, is generally the limiting factor in their performance. It is shown that drift and spread in sensor characteristics are tightly interwoven due to finite sensitivity to biasing parameters. Modern treatments of drift are dynamical under operating conditions, notably so chopping, the sensitivity variation method and the recently introduced van Putten-method. These methods differ in regards to drift-dependence on biasing. In their application to silicon flow sensors, the first two reduce but do not eliminate drift. The geometric van Putten-method leaves biasing invariant, which eliminates drift and obtains uniform sensor-characteristics leaving drift-free operation.

Original languageEnglish
Pages (from-to)172-180
Number of pages9
JournalSensors and Actuators, A: Physical
Volume90
Issue number3
DOIs
Publication statusPublished - 15 Jul 2001
Externally publishedYes

Keywords

  • Chopping
  • Drift
  • Offset
  • Sensitivity variation
  • Van putten-ADM

Fingerprint Dive into the research topics of 'Facing drift: A comparison of three methods'. Together they form a unique fingerprint.

Cite this