Far-field scattering microscopy applied to analysis of slow light, power enhancement, and delay times in uniform Bragg waveguide gratings

W.C.L. Hopman, H. Hoekstra, R. Dekker, L. Zhuang, R.M. de Ridder

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    28 Citations (Scopus)
    89 Downloads (Pure)

    Abstract

    A novel method is presented for determining the group index, intensity enhancement and delay times for waveguide gratings, based on (Rayleigh) scattering observations. This far-field scattering microscopy (FScM) method is compared with the phase shift method and a method that uses the transmission spectrum to quantify the slow wave properties. We find a minimum group velocity of 0.04c and a maximum intensity enhancement of ~14.5 for a 1000-period grating and a maximum group delay of ~80 ps for a 2000-period grating. Furthermore, we show that the FScM method can be used for both displaying the intensity distribution of the Bloch resonances and for investigating out of plane losses. Finally, an application is discussed for the slow-wave grating as index sensor able to detect a minimum cladding index change of $10^{-8}$, assuming a transmission detection limit of $10^{-4}$.
    Original languageEnglish
    Pages (from-to)1851-1870
    Number of pages20
    JournalOptics express
    Volume15
    Issue number4
    DOIs
    Publication statusPublished - 19 Feb 2007

    Keywords

    • IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES
    • IOMS-SNS: SENSORS

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