Far-field scattering microscopy applied to analysis of slow light, power enhancement, and delay times in uniform Bragg waveguide gratings

W.C.L. Hopman, H. Hoekstra, R. Dekker, L. Zhuang, R.M. de Ridder

    Research output: Contribution to journalArticleAcademicpeer-review

    28 Citations (Scopus)
    94 Downloads (Pure)

    Fingerprint Dive into the research topics of 'Far-field scattering microscopy applied to analysis of slow light, power enhancement, and delay times in uniform Bragg waveguide gratings'. Together they form a unique fingerprint.

    Physics & Astronomy