Fast and gentle side approach for atomic force microscopy

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Abstract

Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used
Original languageUndefined
Article number123704
Pages (from-to)-
Number of pages5
JournalReview of scientific instruments
Volume84
Issue number123704
DOIs
Publication statusPublished - 2013

Keywords

  • IR-90050
  • METIS-299427

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