Fast and gentle side approach for atomic force microscopy

W.A. Wessels; Joska Johannes Broekmaat; R.J.L. Beerends; Gertjan Koster; Augustinus J.H.M. Rijnders

doi:10.1063/1.4847055

Fast and gentle side approach for atomic force microscopy

W.A. Wessels, Joska Johannes Broekmaat, R.J.L. Beerends, Gertjan Koster, Augustinus J.H.M. Rijnders

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Abstract

Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used

Original language	Undefined
Article number	123704
Pages (from-to)	-
Number of pages	5
Journal	Review of scientific instruments
Volume	84
Issue number	123704
DOIs	https://doi.org/10.1063/1.4847055
Publication status	Published - 2013

Keywords

IR-90050
METIS-299427

Access to Document

10.1063/1.4847055

Cite this

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abstract = "Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used",

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AU - Koster, Gertjan

AU - Rijnders, Augustinus J.H.M.

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AB - Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used

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