Fast and gentle side approach for atomic force microscopy

W.A. Wessels; J.J. Broekmaat; R.J.L. Beerends; G. Koster; A.J.H.M. Rijnders

doi:10.1063/1.4847055

Fast and gentle side approach for atomic force microscopy

W.A. Wessels
, J.J. Broekmaat
, R.J.L. Beerends
, G. Koster
, A.J.H.M. Rijnders

Research output: Contribution to journal › Article › Academic › peer-review

1 Citation (Scopus)

27 Downloads (Pure)

Abstract

Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used

Original language	English
Article number	123704
Number of pages	5
Journal	Review of scientific instruments
Volume	84
DOIs	https://doi.org/10.1063/1.4847055
Publication status	Published - 2013

Keywords

2020 OA procedure

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10.1063/1.4847055

ArticleFinal published version, 944 KBLicence: Taverne

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title = "Fast and gentle side approach for atomic force microscopy",

abstract = "Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used",

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AU - Koster, G.

AU - Rijnders, A.J.H.M.

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JO - Review of scientific instruments

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Fast and gentle side approach for atomic force microscopy

Abstract

Keywords

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