Fast Thermal Cycling Stress and Degredations in Multilayer Interconnects

Van Hieu Nguyen, Cora Salm, J. Vroemen, B.H. Krabbenborg, J.J. Bisschop, A.J. Mouthaan, F.G. Kuper

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the SAFE Conference
    Place of PublicationVeldhoven, the Netherlands
    Pages136-140
    Number of pages5
    Publication statusPublished - 28 Nov 2001
    Event4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001 - Veldhoven, Netherlands
    Duration: 28 Nov 200130 Nov 2001

    Workshop

    Workshop4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001
    CountryNetherlands
    CityVeldhoven
    Period28/11/0130/11/01

    Keywords

    • METIS-200806

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