Fast Thermal Cycling Stress and Degredations in Multilayer Interconnects

Van Hieu Nguyen, Cora Salm, J. Vroemen, B.H. Krabbenborg, J. Bisschop, A.J. Mouthaan, F.G. Kuper

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of SAFE - ProRISC - SeSens 2001, November 28-30, 2001, Veldhoven, the Netherlands
    Place of PublicationUtrecht
    PublisherSTW
    Pages136-140
    Number of pages5
    ISBN (Print)90-73461-29-4
    Publication statusPublished - 28 Nov 2001
    Event4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001 - Veldhoven, Netherlands
    Duration: 28 Nov 200130 Nov 2001

    Workshop

    Workshop4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001
    Country/TerritoryNetherlands
    CityVeldhoven
    Period28/11/0130/11/01

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