Fast turn-on of an NMOS ESD protection transistor; measurements and simulations

J.R.M. Luchies, C.G.M. de Kort, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    15 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings Electrical Overstress/Electrostatic Discharge symposium 1994
    Place of PublicationLas Vegas
    Pages6.4.1-6.4.7
    Publication statusPublished - 27 Sep 1994

    Keywords

    • METIS-113981

    Cite this

    Luchies, J. R. M., de Kort, C. G. M., & Verweij, J. F. (1994). Fast turn-on of an NMOS ESD protection transistor; measurements and simulations. In Proceedings Electrical Overstress/Electrostatic Discharge symposium 1994 (pp. 6.4.1-6.4.7). Las Vegas.