Fast turn-on of an NMOS ESD protection transistor; measurements and simulations

J.R.M. Luchies, C.G.M. de Kort, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    16 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings Electrical Overstress/Electrostatic Discharge symposium 1994
    Place of PublicationLas Vegas
    Publication statusPublished - 27 Sep 1994


    • METIS-113981

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