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Fast turn-on of an NMOS ESD protection transistor; measurements and simulations

  • J.R.M. Luchies
  • , C.G.M. de Kort
  • , J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings Electrical Overstress/Electrostatic Discharge symposium 1994
    Place of PublicationLas Vegas
    Pages6.4.1-6.4.7
    Publication statusPublished - 27 Sept 1994

    Keywords

    • METIS-113981

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