Fault-model based test generation for mixed-signal circuits

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 17 Nov 1993
    EventFOM Werkgemeenschap Halfgeleiders 1993 - Veldhoven, Netherlands
    Duration: 17 Nov 199318 Nov 1993

    Conference

    ConferenceFOM Werkgemeenschap Halfgeleiders 1993
    CountryNetherlands
    CityVeldhoven
    Period17/11/9318/11/93

    Keywords

    • METIS-117337

    Cite this

    Kaal, V., & Kerkhoff, H. G. (1993). Fault-model based test generation for mixed-signal circuits. -. Poster session presented at FOM Werkgemeenschap Halfgeleiders 1993, Veldhoven, Netherlands.