Fault-model based test generation for mixed-signal circuits

V. Kaal, Hans G. Kerkhoff

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 17 Nov 1993
    EventFOM Werkgemeenschap Halfgeleiders 1993 - Veldhoven, Netherlands
    Duration: 17 Nov 199318 Nov 1993

    Conference

    ConferenceFOM Werkgemeenschap Halfgeleiders 1993
    Country/TerritoryNetherlands
    CityVeldhoven
    Period17/11/9318/11/93

    Keywords

    • METIS-117337

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