Fault Modeling in RSFQ Circuits for Defect-Based Testing of LTS Devices

A.J. Arun, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Applied Superconductivity Conference 2004
    Place of PublicationJacksonville, USA
    Pages76-
    Number of pages1
    Publication statusPublished - 3 Oct 2004
    Event2004 Applied Superconductivity Conference, ASC 2004 - Jacksonville, United States
    Duration: 3 Oct 20048 Oct 2004

    Conference

    Conference2004 Applied Superconductivity Conference, ASC 2004
    Abbreviated titleASC
    CountryUnited States
    CityJacksonville
    Period3/10/048/10/04

    Keywords

    • METIS-218952

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