Fault simulation for delay faults

Y. Xing, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of the 2nd European Test Conference
    Place of PublicationMunich
    Pages517-
    Number of pages0
    Publication statusPublished - 10 Apr 1991

    Keywords

    • METIS-112963

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