FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors

L. La Spina*, N. Nenadović, V. D'Alessandro, L. K. Nanver, N. Rinaldi

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Abstract

In this paper, we present a new simulation tool, which can be effectively adopted for the electrothermal analysis of multifinger bipolar transistors. The program is based on an optimized procedure for solving the nonlinear system of equations governing the electrothermal device behavior. Features like model accuracy, short computation time, flexibility, and user friendliness make the proposed software a good candidate for optimizing both reliability and performance of modern transistors with complex layouts.

Original languageEnglish
Title of host publicationEUROCON 2005 - The International Conference on Computer as a Tool
Pages879-882
Number of pages4
VolumeI
DOIs
Publication statusPublished - 1 Dec 2005
Externally publishedYes
EventEUROCON 2005 - the International Conference on "Computer as a Tool" - Belgrade, Serbia
Duration: 21 Nov 200524 Nov 2005

Conference

ConferenceEUROCON 2005 - the International Conference on "Computer as a Tool"
CountrySerbia
CityBelgrade
Period21/11/0524/11/05

Keywords

  • Bipolar transistor
  • Electrothermal effects
  • Electrothermal simulation tools
  • Reliability
  • Thermal design

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  • Cite this

    La Spina, L., Nenadović, N., D'Alessandro, V., Nanver, L. K., & Rinaldi, N. (2005). FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors. In EUROCON 2005 - The International Conference on Computer as a Tool (Vol. I, pp. 879-882). [1630075] https://doi.org/10.1109/EURCON.2005.1630075