FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors

L. La Spina; N. Nenadović; V. D'Alessandro; L. K. Nanver; N. Rinaldi

doi:10.1109/EURCON.2005.1630075

FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors

L. La Spina^*, N. Nenadović, V. D'Alessandro, L. K. Nanver, N. Rinaldi

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

Abstract

In this paper, we present a new simulation tool, which can be effectively adopted for the electrothermal analysis of multifinger bipolar transistors. The program is based on an optimized procedure for solving the nonlinear system of equations governing the electrothermal device behavior. Features like model accuracy, short computation time, flexibility, and user friendliness make the proposed software a good candidate for optimizing both reliability and performance of modern transistors with complex layouts.

Original language	English
Title of host publication	EUROCON 2005 - The International Conference on Computer as a Tool
Pages	879-882
Number of pages	4
Volume	I
DOIs	https://doi.org/10.1109/EURCON.2005.1630075
Publication status	Published - 1 Dec 2005
Externally published	Yes
Event	EUROCON 2005 - the International Conference on "Computer as a Tool" - Belgrade, Serbia Duration: 21 Nov 2005 → 24 Nov 2005

Conference

Conference	EUROCON 2005 - the International Conference on "Computer as a Tool"
Country/Territory	Serbia
City	Belgrade
Period	21/11/05 → 24/11/05

Keywords

Bipolar transistor
Electrothermal effects
Electrothermal simulation tools
Reliability
Thermal design

Access to Document

10.1109/EURCON.2005.1630075

Cite this

@inproceedings{0b0582af1c584472b099ec225c110cd5,

title = "FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors",

abstract = "In this paper, we present a new simulation tool, which can be effectively adopted for the electrothermal analysis of multifinger bipolar transistors. The program is based on an optimized procedure for solving the nonlinear system of equations governing the electrothermal device behavior. Features like model accuracy, short computation time, flexibility, and user friendliness make the proposed software a good candidate for optimizing both reliability and performance of modern transistors with complex layouts.",

keywords = "Bipolar transistor, Electrothermal effects, Electrothermal simulation tools, Reliability, Thermal design",

author = "{La Spina}, L. and N. Nenadovi{\'c} and V. D'Alessandro and Nanver, {L. K.} and N. Rinaldi",

year = "2005",

month = dec,

day = "1",

doi = "10.1109/EURCON.2005.1630075",

language = "English",

isbn = "9781424400492",

volume = "I",

pages = "879--882",

booktitle = "EUROCON 2005 - The International Conference on Computer as a Tool",

note = "EUROCON 2005 - the International Conference on {"}Computer as a Tool{"} ; Conference date: 21-11-2005 Through 24-11-2005",

}

La Spina, L, Nenadović, N, D'Alessandro, V, Nanver, LK & Rinaldi, N 2005, FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors. in EUROCON 2005 - The International Conference on Computer as a Tool. vol. I, 1630075, pp. 879-882, EUROCON 2005 - the International Conference on "Computer as a Tool", Belgrade, Serbia, 21/11/05. https://doi.org/10.1109/EURCON.2005.1630075

TY - GEN

T1 - FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors

AU - La Spina, L.

AU - Nenadović, N.

AU - D'Alessandro, V.

AU - Nanver, L. K.

AU - Rinaldi, N.

PY - 2005/12/1

Y1 - 2005/12/1

N2 - In this paper, we present a new simulation tool, which can be effectively adopted for the electrothermal analysis of multifinger bipolar transistors. The program is based on an optimized procedure for solving the nonlinear system of equations governing the electrothermal device behavior. Features like model accuracy, short computation time, flexibility, and user friendliness make the proposed software a good candidate for optimizing both reliability and performance of modern transistors with complex layouts.

AB - In this paper, we present a new simulation tool, which can be effectively adopted for the electrothermal analysis of multifinger bipolar transistors. The program is based on an optimized procedure for solving the nonlinear system of equations governing the electrothermal device behavior. Features like model accuracy, short computation time, flexibility, and user friendliness make the proposed software a good candidate for optimizing both reliability and performance of modern transistors with complex layouts.

KW - Bipolar transistor

KW - Electrothermal effects

KW - Electrothermal simulation tools

KW - Reliability

KW - Thermal design

UR - http://www.scopus.com/inward/record.url?scp=33847787235&partnerID=8YFLogxK

U2 - 10.1109/EURCON.2005.1630075

DO - 10.1109/EURCON.2005.1630075

M3 - Conference contribution

AN - SCOPUS:33847787235

SN - 9781424400492

VL - I

SP - 879

EP - 882

BT - EUROCON 2005 - The International Conference on Computer as a Tool

T2 - EUROCON 2005 - the International Conference on "Computer as a Tool"

Y2 - 21 November 2005 through 24 November 2005

ER -

FEAT - A simulation tool for electrothermal analysis of multifinger bipolar transistors

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