Feature detection with a self-organizing neural network

L.P.J. Veelenturf

Feature detection with a self-organizing neural network

L.P.J. Veelenturf

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Measurement and Artificial Neural Networks
Subtitle of host publication	Themadag van de Werkgemeenschap Meten, 3 november 1993, Utrecht
Place of Publication	Utrecht, The Netherlands
Publisher	Stichting Meet- en Besturingstechnologie
Pages	21-36
Number of pages	16
ISBN (Print)	90-801307-2-9
Publication status	Published - 27 Jan 1993
Event	Measurement and Artificial Neural Networks: Themadag van de Werkgemeenschap Meten - Utrecht, Netherlands Duration: 3 Nov 1993 → 3 Nov 1993

Conference

Conference	Measurement and Artificial Neural Networks
Country/Territory	Netherlands
City	Utrecht
Period	3/11/93 → 3/11/93

Keywords

METIS-113100

Cite this

@inproceedings{233806b74f754a7eaba96f088a2c4743,

title = "Feature detection with a self-organizing neural network",

keywords = "METIS-113100",

author = "L.P.J. Veelenturf",

year = "1993",

month = jan,

day = "27",

language = "English",

isbn = "90-801307-2-9",

pages = "21--36",

booktitle = "Measurement and Artificial Neural Networks",

publisher = "Stichting Meet- en Besturingstechnologie",

note = "Measurement and Artificial Neural Networks : Themadag van de Werkgemeenschap Meten ; Conference date: 03-11-1993 Through 03-11-1993",

}

Feature detection with a self-organizing neural network. / Veelenturf, L.P.J.
Measurement and Artificial Neural Networks: Themadag van de Werkgemeenschap Meten, 3 november 1993, Utrecht. Utrecht, The Netherlands: Stichting Meet- en Besturingstechnologie, 1993. p. 21-36.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Feature detection with a self-organizing neural network

AU - Veelenturf, L.P.J.

PY - 1993/1/27

Y1 - 1993/1/27

KW - METIS-113100

M3 - Conference contribution

SN - 90-801307-2-9

SP - 21

EP - 36

BT - Measurement and Artificial Neural Networks

PB - Stichting Meet- en Besturingstechnologie

CY - Utrecht, The Netherlands

T2 - Measurement and Artificial Neural Networks

Y2 - 3 November 1993 through 3 November 1993

ER -