@inproceedings{25cbba8220f7428683e8f736f4b6c056,
title = "FeFET and NCFET for Future Neural Networks: Visions and Opportunities",
abstract = "The goal of this special session paper is to introduce and discuss different emerging technologies for logic circuitry and memory as well as new lightweight architectures for neural networks. We demonstrate how the ever-increasing complexity in Artificial Intelligent (AI) applications, resulting in an immense increase in the computational power, necessitates inevitably employing innovations starting from the underlying devices all the way up to the architectures. Two different promising emerging technologies will be presented: (i) Negative Capacitance Field-Effect Transistor (NCFET) as a new beyond-CMOS technology with advantages for offering low power and/or higher accuracy for neural network inference. (ii) Ferroelectric FET (FeFET) as a novel non-volatile, area-efficient and ultra-low power memory device. In addition, we demonstrate how Binarized Neural Networks (BNNs) offer a promising alternative for traditional Deep Neural Networks (DNNs) due to its lightweight hardware implementation. Finally, we present the challenges from combining FeFET-based NVM with NNs and summarize our perspectives for future NNs and the vital role that emerging technologies may play. ",
author = "Mikail Yayla and Chen, {Kuan Hsun} and Georgios Zervakis and Jorg Henkel and Chen, {Jian Jia} and Hussam Amrouch",
note = "Funding Information: ACKNOWLEDGMENTS Authors would like to thank Y. Chauhan from IIT Kan-pur for NCFET modeling, K. Ni from Rochester Institute of Technology for FeFET modeling, S. Buschj{\"a}ger and L. Pfahler from TU Dortmund for their support and insights on the optimization of NNs. This work is supported in part by Deutsche Forschungsgemeinshaft (DFG) project OneMemory (project number 405422836) and as part of the Collaborative Research Center SFB 876 ”Providing Information by Resource-Constrained Analysis” (project number 124020371). Publisher Copyright: {\textcopyright} 2021 EDAA.; Design, Automation and Test in Europe Conference and Exhibition, DATE 2021, DATE 2021 ; Conference date: 01-02-2021 Through 05-02-2021",
year = "2021",
month = feb,
day = "1",
doi = "10.23919/DATE51398.2021.9473978",
language = "English",
isbn = "978-1-7281-6336-9",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "IEEE",
pages = "300--305",
booktitle = "Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021",
address = "United States",
}