FeFET and NCFET for Future Neural Networks: Visions and Opportunities

Mikail Yayla, Kuan Hsun Chen, Georgios Zervakis, Jorg Henkel, Jian Jia Chen, Hussam Amrouch

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The goal of this special session paper is to introduce and discuss different emerging technologies for logic circuitry and memory as well as new lightweight architectures for neural networks. We demonstrate how the ever-increasing complexity in Artificial Intelligent (AI) applications, resulting in an immense increase in the computational power, necessitates inevitably employing innovations starting from the underlying devices all the way up to the architectures. Two different promising emerging technologies will be presented: (i) Negative Capacitance Field-Effect Transistor (NCFET) as a new beyond-CMOS technology with advantages for offering low power and/or higher accuracy for neural network inference. (ii) Ferroelectric FET (FeFET) as a novel non-volatile, area-efficient and ultra-low power memory device. In addition, we demonstrate how Binarized Neural Networks (BNNs) offer a promising alternative for traditional Deep Neural Networks (DNNs) due to its lightweight hardware implementation. Finally, we present the challenges from combining FeFET-based NVM with NNs and summarize our perspectives for future NNs and the vital role that emerging technologies may play.

Original languageEnglish
Title of host publicationProceedings of the 2021 Design, Automation and Test in Europe, DATE 2021
PublisherIEEE
Pages300-305
Number of pages6
ISBN (Electronic)9783981926354
ISBN (Print)978-1-7281-6336-9
DOIs
Publication statusPublished - 1 Feb 2021
Externally publishedYes
Event2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021 - Virtual, Online
Duration: 1 Feb 20215 Feb 2021

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2021-February
ISSN (Print)1530-1591

Conference

Conference2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021
CityVirtual, Online
Period1/02/215/02/21

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