Ferroelectric fatigue of PbZr0.52Ti0.48O3 epitaxial thin films: from cause and mechanism to strategies to avoid

Minh Thanh Do

Research output: Contribution to conference › Poster › Academic

Original language	English
Publication status	Published - 2018
Event	25th International workshop on oxide electronics, iWOE 2018 - Les Diablerets, Switzerland Duration: 1 Oct 2018 → 3 Oct 2018 Conference number: 25 https://www.unige.ch/iwoe25/

Conference	25th International workshop on oxide electronics, iWOE 2018
Abbreviated title	iWOE 2018
Country/Territory	Switzerland
City	Les Diablerets
Period	1/10/18 → 3/10/18
Internet address	https://www.unige.ch/iwoe25/

Cite this

@conference{00e17dc86dde41aba5f3faf5803be451,

title = "Ferroelectric fatigue of PbZr0.52Ti0.48O3 epitaxial thin films: from cause and mechanism to strategies to avoid",

author = "Do, {Minh Thanh}",

year = "2018",

language = "English",

note = "25th International workshop on oxide electronics, iWOE 2018, iWOE 2018 ; Conference date: 01-10-2018 Through 03-10-2018",

url = "https://www.unige.ch/iwoe25/",

}