|Publication status||Published - 2018|
|Event||25th International workshop on oxide electronics, iWOE 2018 - Les Diablerets, Switzerland|
Duration: 1 Oct 2018 → 3 Oct 2018
Conference number: 25
|Conference||25th International workshop on oxide electronics, iWOE 2018|
|Abbreviated title||iWOE 2018|
|Period||1/10/18 → 3/10/18|
Do, M. T. (2018). Ferroelectric fatigue of PbZr0.52Ti0.48O3 epitaxial thin films: from cause and mechanism to strategies to avoid. Poster session presented at 25th International workshop on oxide electronics, iWOE 2018, Les Diablerets, Switzerland.