Fiber-top atomic force microscope

D. Iannuzzi, S. Deladi, J.W. Berenschot, S. de Man, K. Heeck, Michael Curt Elwenspoek

    Research output: Contribution to journalArticleAcademicpeer-review

    34 Citations (Scopus)
    60 Downloads (Pure)

    Abstract

    We present the implementation of an atomic force microscope (AFM) based on fiber-top design. Our results demonstrate that the performances of fiber-top AFMs in contact mode are comparable to those of similar commercially available instruments. Our device thus represents an interesting alternative to existing AFMs, particularly for applications outside specialized research laboratories, where a compact, user-friendly, and versatile tool might often be preferred.
    Original languageEnglish
    Article number106105
    Number of pages3
    JournalReview of scientific instruments
    Volume77
    DOIs
    Publication statusPublished - 30 Oct 2006

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