Field Emission to control nanometer tip-medium distances in probe storage

A.J. le Fèbre, Leon Abelmann, J.C. Lodder

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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    Abstract

    In this work, we present a novel concept for high resolution proximity sending based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation.
    Original languageUndefined
    Title of host publicationTechnical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007)
    Place of PublicationLos Alamitos
    PublisherIEEE Computer Society Press
    Pages223-224
    Number of pages2
    ISBN (Print)1-4244-1134-3
    DOIs
    Publication statusPublished - Jul 2007
    Event2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007 - Holiday Inn Chicago Mart Plaza Hotel, Chicago, United States
    Duration: 8 Jul 200712 Jul 2007
    Conference number: 20

    Publication series

    Name
    PublisherIEEE Computer Society Press

    Conference

    Conference2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007
    Abbreviated titleIVNC
    CountryUnited States
    CityChicago
    Period8/07/0712/07/07

    Keywords

    • METIS-245712
    • TST-SMI: Formerly in EWI-SMI
    • EWI-9807
    • IR-67101
    • TST-uSPAM: micro Scanning Probe Array Memory

    Cite this

    le Fèbre, A. J., Abelmann, L., & Lodder, J. C. (2007). Field Emission to control nanometer tip-medium distances in probe storage. In Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007) (pp. 223-224). Los Alamitos: IEEE Computer Society Press. https://doi.org/10.1109/IVNC.2007.4481005