Field Emission to control nanometer tip-medium distances in probe storage

A.J. le Fèbre; Leon Abelmann; J.C. Lodder

doi:10.1109/IVNC.2007.4481005

Field Emission to control nanometer tip-medium distances in probe storage

A.J. le Fèbre
, Leon Abelmann
, J.C. Lodder

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

254 Downloads (Pure)

Abstract

In this work, we present a novel concept for high resolution proximity sending based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation.

Original language	Undefined
Title of host publication	Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007)
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	223-224
Number of pages	2
ISBN (Print)	1-4244-1134-3
DOIs	https://doi.org/10.1109/IVNC.2007.4481005
Publication status	Published - Jul 2007
Event	2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007 - Holiday Inn Chicago Mart Plaza Hotel, Chicago, United States Duration: 8 Jul 2007 → 12 Jul 2007 Conference number: 20

Publication series

Name
Publisher	IEEE Computer Society Press

Conference

Conference	2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007
Abbreviated title	IVNC
Country/Territory	United States
City	Chicago
Period	8/07/07 → 12/07/07

Keywords

METIS-245712
TST-SMI: Formerly in EWI-SMI
EWI-9807
IR-67101
TST-uSPAM: micro Scanning Probe Array Memory

Access to Document

10.1109/IVNC.2007.4481005

Cite this

@inproceedings{e2fa50c251db49b6b16b9f17eafad18c,

title = "Field Emission to control nanometer tip-medium distances in probe storage",

abstract = "In this work, we present a novel concept for high resolution proximity sending based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation.",

keywords = "METIS-245712, TST-SMI: Formerly in EWI-SMI, EWI-9807, IR-67101, TST-uSPAM: micro Scanning Probe Array Memory",

author = "\{le F{\`e}bre\}, A.J. and Leon Abelmann and J.C. Lodder",

note = "IEEE 07TH8951; 2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007 ; Conference date: 08-07-2007 Through 12-07-2007",

year = "2007",

month = jul,

doi = "10.1109/IVNC.2007.4481005",

language = "Undefined",

isbn = "1-4244-1134-3",

publisher = "IEEE",

pages = "223--224",

booktitle = "Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007)",

address = "United States",

}

le Fèbre, AJ, Abelmann, L & Lodder, JC 2007, Field Emission to control nanometer tip-medium distances in probe storage. in Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007). IEEE, Los Alamitos, pp. 223-224, 2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007, Chicago, Illinois, United States, 8/07/07. https://doi.org/10.1109/IVNC.2007.4481005

TY - GEN

T1 - Field Emission to control nanometer tip-medium distances in probe storage

AU - le Fèbre, A.J.

AU - Abelmann, Leon

AU - Lodder, J.C.

N1 - Conference code: 20

PY - 2007/7

Y1 - 2007/7

N2 - In this work, we present a novel concept for high resolution proximity sending based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation.

AB - In this work, we present a novel concept for high resolution proximity sending based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation.

KW - METIS-245712

KW - TST-SMI: Formerly in EWI-SMI

KW - EWI-9807

KW - IR-67101

KW - TST-uSPAM: micro Scanning Probe Array Memory

U2 - 10.1109/IVNC.2007.4481005

DO - 10.1109/IVNC.2007.4481005

M3 - Conference contribution

SN - 1-4244-1134-3

SP - 223

EP - 224

BT - Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007)

PB - IEEE

CY - Los Alamitos

T2 - 2007 IEEE 20th International Vacuum Nanoelectronics Conference, IVNC 2007

Y2 - 8 July 2007 through 12 July 2007

ER -