Field emission to control tip-sample distance in magnetic probe recording

A.J. le Fèbre, R. Lüttge, L. Abelmann, J.C. Lodder

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Abstract

An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.
Original languageEnglish
Pages (from-to)673-677
Number of pages5
JournalJournal of physics: Conference series
Volume61
Issue number1
DOIs
Publication statusPublished - 2007
EventInternational Conference on Nanoscience and Technology, ICN+T 2006 - Basel, Switzerland
Duration: 30 Jul 20064 Aug 2006

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