Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 673-677 |
| Number of pages | 5 |
| Journal | Journal of physics: Conference series |
| Volume | 61 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2007 |
| Event | International Conference on Nanoscience and Technology, ICN+T 2006 - Basel, Switzerland Duration: 30 Jul 2006 → 4 Aug 2006 |
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Field emission to control tip-sample distance in magnetic probe recording. / le Fèbre, A.J.; Lüttge, R.; Abelmann, L.; Lodder, J.C.
In: Journal of physics: Conference series, Vol. 61, No. 1, 2007, p. 673-677.Research output: Contribution to journal › Conference article › Academic › peer-review
TY - JOUR
T1 - Field emission to control tip-sample distance in magnetic probe recording
AU - le Fèbre, A.J.
AU - Lüttge, R.
AU - Abelmann, L.
AU - Lodder, J.C.
PY - 2007
Y1 - 2007
N2 - An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.
AB - An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.
U2 - 10.1088/1742-6596/61/1/135
DO - 10.1088/1742-6596/61/1/135
M3 - Conference article
VL - 61
SP - 673
EP - 677
JO - Journal of physics: Conference series
JF - Journal of physics: Conference series
SN - 1742-6588
IS - 1
ER -