Field emission to control tip-sample distance in magnetic probe recording

A.J. le Fèbre, R. Lüttge, L. Abelmann, J.C. Lodder

Research output: Contribution to journalConference articleAcademicpeer-review

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Abstract

An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.
Original languageEnglish
Pages (from-to)673-677
Number of pages5
JournalJournal of physics: Conference series
Volume61
Issue number1
DOIs
Publication statusPublished - 2007
EventInternational Conference on Nanoscience and Technology, ICN+T 2006 - Basel, Switzerland
Duration: 30 Jul 20064 Aug 2006

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magnetic probes
field emission
recording
probes
chromium
diamonds
conduction
scanning
electric fields
electric potential

Cite this

le Fèbre, A.J. ; Lüttge, R. ; Abelmann, L. ; Lodder, J.C. / Field emission to control tip-sample distance in magnetic probe recording. In: Journal of physics: Conference series. 2007 ; Vol. 61, No. 1. pp. 673-677.
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Field emission to control tip-sample distance in magnetic probe recording. / le Fèbre, A.J.; Lüttge, R.; Abelmann, L.; Lodder, J.C.

In: Journal of physics: Conference series, Vol. 61, No. 1, 2007, p. 673-677.

Research output: Contribution to journalConference articleAcademicpeer-review

TY - JOUR

T1 - Field emission to control tip-sample distance in magnetic probe recording

AU - le Fèbre, A.J.

AU - Lüttge, R.

AU - Abelmann, L.

AU - Lodder, J.C.

PY - 2007

Y1 - 2007

N2 - An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.

AB - An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.

U2 - 10.1088/1742-6596/61/1/135

DO - 10.1088/1742-6596/61/1/135

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