Abstract
An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.
| Original language | English |
|---|---|
| Pages (from-to) | 673-677 |
| Number of pages | 5 |
| Journal | Journal of physics: Conference series |
| Volume | 61 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2007 |
| Event | International Conference on Nanoscience and Technology, ICN+T 2006 - Basel, Switzerland Duration: 30 Jul 2006 → 4 Aug 2006 |
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le Fèbre, A. J., Lüttge, R., Abelmann, L., & Lodder, J. C. (2007). Field emission to control tip-sample distance in magnetic probe recording. Journal of physics: Conference series, 61(1), 673-677. https://doi.org/10.1088/1742-6596/61/1/135