Field emission to control tip-sample distance in magnetic probe recording

A.J. le Fèbre; R. Lüttge; L. Abelmann; J.C. Lodder

doi:10.1088/1742-6596/61/1/135

Field emission to control tip-sample distance in magnetic probe recording

A.J. le Fèbre, R. Lüttge, L. Abelmann, J.C. Lodder

Research output: Contribution to journal › Conference article › Academic › peer-review

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Abstract

An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.

Original language	English
Pages (from-to)	673-677
Number of pages	5
Journal	Journal of physics: Conference series
Volume	61
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/61/1/135
Publication status	Published - 2007
Event	International Conference on Nanoscience and Technology, ICN+T 2006 - Basel, Switzerland Duration: 30 Jul 2006 → 4 Aug 2006

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@article{3ecf2f79a788420d89449136108faf25,

title = "Field emission to control tip-sample distance in magnetic probe recording",

abstract = "An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.",

author = "{le F{\`e}bre}, A.J. and R. L{\"u}ttge and L. Abelmann and J.C. Lodder",

year = "2007",

doi = "10.1088/1742-6596/61/1/135",

language = "English",

volume = "61",

pages = "673--677",

journal = "Journal of physics: Conference series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "International Conference on Nanoscience and Technology, ICN+T 2006, ICN+T ; Conference date: 30-07-2006 Through 04-08-2006",

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TY - JOUR

T1 - Field emission to control tip-sample distance in magnetic probe recording

AU - le Fèbre, A.J.

AU - Lüttge, R.

AU - Abelmann, L.

AU - Lodder, J.C.

PY - 2007

Y1 - 2007

N2 - An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.

AB - An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.

U2 - 10.1088/1742-6596/61/1/135

DO - 10.1088/1742-6596/61/1/135

M3 - Conference article

VL - 61

SP - 673

EP - 677

JO - Journal of physics: Conference series

JF - Journal of physics: Conference series

SN - 1742-6588

IS - 1

T2 - International Conference on Nanoscience and Technology, ICN+T 2006

Y2 - 30 July 2006 through 4 August 2006

ER -