Field of inserted charges during Electron Microscopy of non-conducting samples

T. Amlaki, N. Budko, E. van den Bosch, N. Debernardi, U. Ebert, V. Leung, M. Mink, C. Prastani, S. Sluyterman, M. Snelder, J. Teunissen, B. Thijsse, J. Thijssen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationUnknown
Place of PublicationLeiden
Pages-
Publication statusPublished - 17 Oct 2011
EventPhysics with Industry 2011 - Leiden
Duration: 17 Oct 201121 Oct 2011

Conference

ConferencePhysics with Industry 2011
CityLeiden
Period17/10/1121/10/11

Keywords

  • METIS-282806

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