Film thickness prediction in wide elliptical EHL contacts

A. Canzi*, P. Sainsot, C. H. Venner, A. A. Lubrecht

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    The minimum and central film thickness evolution of EHL contacts were measured. Several parameters were kept identical between the elliptical contact and the equivalent line contact, e.g., base oil viscosity. A new film thickness equation for elliptical contacts, including the equivalent line contact prediction, is put forward. The trend for (very) wide elliptical contacts is fundamentally flawed. The classical film thickness predictions tend to zero for infinitely wide contacts. For most elliptical contacts, the minimum film thickness is found on the central line. This is an abstract of a paper presented at the 2009 World Tribology Congress (Kyoto, Japan 9/6-11/2009).

    Original languageEnglish
    Title of host publicationWorld Tribology Congress 2009 - Proceedings
    Place of PublicationTokyo
    PublisherJAST: Japanese Society of Tribologists
    Number of pages1
    ISBN (Print)9784990013998
    Publication statusPublished - 1 Jan 2009
    EventWorld Tribology Congress 2009 - Kyoto International Conference Center, Kyoto, Japan
    Duration: 6 Sep 200911 Sep 2009

    Conference

    ConferenceWorld Tribology Congress 2009
    Abbreviated titleWTC 2009
    CountryJapan
    CityKyoto
    Period6/09/0911/09/09

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