Film thickness prediction in wide elliptical EHL contacts

A. Canzi; P. Sainsot; C. H. Venner; A. A. Lubrecht

Film thickness prediction in wide elliptical EHL contacts

A. Canzi^*, P. Sainsot, C. H. Venner, A. A. Lubrecht

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

The minimum and central film thickness evolution of EHL contacts were measured. Several parameters were kept identical between the elliptical contact and the equivalent line contact, e.g., base oil viscosity. A new film thickness equation for elliptical contacts, including the equivalent line contact prediction, is put forward. The trend for (very) wide elliptical contacts is fundamentally flawed. The classical film thickness predictions tend to zero for infinitely wide contacts. For most elliptical contacts, the minimum film thickness is found on the central line. This is an abstract of a paper presented at the 2009 World Tribology Congress (Kyoto, Japan 9/6-11/2009).

Original language	English
Title of host publication	World Tribology Congress 2009 - Proceedings
Place of Publication	Tokyo
Publisher	JAST: Japanese Society of Tribologists
Number of pages	1
ISBN (Print)	9784990013998
Publication status	Published - 1 Jan 2009
Event	World Tribology Congress 2009 - Kyoto International Conference Center, Kyoto, Japan Duration: 6 Sept 2009 → 11 Sept 2009

Conference

Conference	World Tribology Congress 2009
Abbreviated title	WTC 2009
Country/Territory	Japan
City	Kyoto
Period	6/09/09 → 11/09/09

Cite this

@inproceedings{ba2066e937134ce98e4fc3ecb3f81ec7,

title = "Film thickness prediction in wide elliptical EHL contacts",

abstract = "The minimum and central film thickness evolution of EHL contacts were measured. Several parameters were kept identical between the elliptical contact and the equivalent line contact, e.g., base oil viscosity. A new film thickness equation for elliptical contacts, including the equivalent line contact prediction, is put forward. The trend for (very) wide elliptical contacts is fundamentally flawed. The classical film thickness predictions tend to zero for infinitely wide contacts. For most elliptical contacts, the minimum film thickness is found on the central line. This is an abstract of a paper presented at the 2009 World Tribology Congress (Kyoto, Japan 9/6-11/2009).",

author = "A. Canzi and P. Sainsot and Venner, \{C. H.\} and Lubrecht, \{A. A.\}",

year = "2009",

month = jan,

day = "1",

language = "English",

isbn = "9784990013998",

booktitle = "World Tribology Congress 2009 - Proceedings",

publisher = "JAST: Japanese Society of Tribologists",

address = "Japan",

note = "World Tribology Congress 2009, WTC 2009 ; Conference date: 06-09-2009 Through 11-09-2009",

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TY - GEN

T1 - Film thickness prediction in wide elliptical EHL contacts

AU - Canzi, A.

AU - Sainsot, P.

AU - Venner, C. H.

AU - Lubrecht, A. A.

PY - 2009/1/1

Y1 - 2009/1/1

N2 - The minimum and central film thickness evolution of EHL contacts were measured. Several parameters were kept identical between the elliptical contact and the equivalent line contact, e.g., base oil viscosity. A new film thickness equation for elliptical contacts, including the equivalent line contact prediction, is put forward. The trend for (very) wide elliptical contacts is fundamentally flawed. The classical film thickness predictions tend to zero for infinitely wide contacts. For most elliptical contacts, the minimum film thickness is found on the central line. This is an abstract of a paper presented at the 2009 World Tribology Congress (Kyoto, Japan 9/6-11/2009).

AB - The minimum and central film thickness evolution of EHL contacts were measured. Several parameters were kept identical between the elliptical contact and the equivalent line contact, e.g., base oil viscosity. A new film thickness equation for elliptical contacts, including the equivalent line contact prediction, is put forward. The trend for (very) wide elliptical contacts is fundamentally flawed. The classical film thickness predictions tend to zero for infinitely wide contacts. For most elliptical contacts, the minimum film thickness is found on the central line. This is an abstract of a paper presented at the 2009 World Tribology Congress (Kyoto, Japan 9/6-11/2009).

UR - https://www.scopus.com/pages/publications/77952690347

M3 - Conference contribution

AN - SCOPUS:77952690347

SN - 9784990013998

BT - World Tribology Congress 2009 - Proceedings

PB - JAST: Japanese Society of Tribologists

CY - Tokyo

T2 - World Tribology Congress 2009

Y2 - 6 September 2009 through 11 September 2009

ER -

Film thickness prediction in wide elliptical EHL contacts

Abstract

Conference

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