Finite size effects and top-gating in patterned, defect-engineered oxide interfaces

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 19 Jan 2016
EventPhysics@FOM Veldhoven 2016 - NH Koningshof Veldhoven, Veldhoven, The Netherlands, Netherlands
Duration: 20 Jan 201620 Jan 2016

Conference

ConferencePhysics@FOM Veldhoven 2016
Abbreviated titleFOM
CountryNetherlands
CityVeldhoven, The Netherlands
Period20/01/1620/01/16

Keywords

  • METIS-319557

Cite this

Geessinck, J., Smink, A. E. M., Banerjee, N., Stehno, M. P., Brinkman, A., van der Wiel, W. G., ... Rijnders, A. J. H. M. (2016). Finite size effects and top-gating in patterned, defect-engineered oxide interfaces. -. Poster session presented at Physics@FOM Veldhoven 2016, Veldhoven, The Netherlands, Netherlands.