Fluorescence Lifetime Contrast Combined with Probe Microscopy

O.H. Willemsen, O.F.J. Noordman, F.B. Segerink, A.G.T. Ruiter, M.H.P. Moers, N.F. van Hulst

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Abstract

Fluorescence lifetime imaging is combined with atomic force microscopy in an integrated scanning microscope using a silicon-nitride probe. The time decay of fluorescence is measured at each image position with a resolution of 50 ps by time correlated single photon counting using a frequency doubled mode-locked Ti-Sapphire laser and fast electronics. Images of a mixture of fluorescence labelled latex spheres are presented where the lifetime contrast of the different spheres can be directly correlated to the topography as detected by force microscopy.
Original languageEnglish
Title of host publicationOptics at the nanometer scale
Subtitle of host publicationimaging and storing with photonic near fields
EditorsM. Nieto-Vesperinas, N. García
Place of PublicationDordrecht
PublisherKluwer Academic Publishers
Pages223-233
Number of pages11
ISBN (Print)0-7923-4020-5
Publication statusPublished - 1996
EventNATO Advanced Research Workshop on Near Field Optics 1995: Recent Progress and Perspectives - La Cristalera, Miraflores, Madrid, Spain
Duration: 11 Sep 199515 Sep 1995

Publication series

NameNATO ASI Series E
PublisherKluwer Academic Publishers
Volume319

Workshop

WorkshopNATO Advanced Research Workshop on Near Field Optics 1995
CountrySpain
CityMadrid
Period11/09/9515/09/95

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Cite this

Willemsen, O. H., Noordman, O. F. J., Segerink, F. B., Ruiter, A. G. T., Moers, M. H. P., & van Hulst, N. F. (1996). Fluorescence Lifetime Contrast Combined with Probe Microscopy. In M. Nieto-Vesperinas, & N. García (Eds.), Optics at the nanometer scale: imaging and storing with photonic near fields (pp. 223-233). (NATO ASI Series E; Vol. 319). Dordrecht: Kluwer Academic Publishers.