@inbook{bd5b33aa539a48fe9787b7ccf287f181,
title = "Fluorescence Lifetime Contrast Combined with Probe Microscopy",
abstract = "Fluorescence lifetime imaging is combined with atomic force microscopy in an integrated scanning microscope using a silicon-nitride probe. The time decay of fluorescence is measured at each image position with a resolution of 50 ps by time correlated single photon counting using a frequency doubled mode-locked Ti-Sapphire laser and fast electronics. Images of a mixture of fluorescence labelled latex spheres are presented where the lifetime contrast of the different spheres can be directly correlated to the topography as detected by force microscopy.",
author = "O.H. Willemsen and O.F.J. Noordman and F.B. Segerink and A.G.T. Ruiter and M.H.P. Moers and {van Hulst}, N.F.",
year = "1996",
language = "English",
isbn = "0-7923-4020-5",
series = "NATO ASI Series E",
publisher = "Kluwer Academic Publishers",
pages = "223--233",
editor = "M. Nieto-Vesperinas and N. Garc{\'i}a",
booktitle = "Optics at the nanometer scale",
address = "Netherlands",
note = "NATO Advanced Research Workshop on Near Field Optics 1995 : Recent Progress and Perspectives ; Conference date: 11-09-1995 Through 15-09-1995",
}