Fluorescence scanning near-field optical microscopy in reflection

Alain Jalocha, Marco H.P. Moers, Niek F. van Hulst

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

19 Downloads (Pure)

Abstract

A Fluorescence Scanning Near-Field Optical Microscope operated in reflection is presented. A pulled optical fiber is used both as an emitter for the exciting light and a collector for the generated fluorescence. The advantage of this set-up is the use of the fiber tip as an emitter and a collector. The sample is locally illuminated and no extra optical elements are needed for the detection. We will describe the shear force set-up which is used to control the tip to surface distance. Direct correlation between force map and optical signal is thus possible. Fluorescence images have been obtained on Langmuir-Blodgett films where we estimate the resolution at 200 nm. Moreover the anisotropic property of the monolayer allows polarization contrast measurements. Thus, we show true optical contrast due to fluorescence and polarization is applicable to this configuration. Artifacts in LB films shear force image are discussed. Shear force approach curves obtained on glass and polymer domains are presented to explain the chemical origin of the phenomenon.
Original languageEnglish
Title of host publicationNear-Field Optics
Subtitle of host publicationSPIE's 1995 International Conference on Optical Science, Engineering, and Instrumentation, 9-14 July 1995
EditorsMichael A. Paesler, Patrick J. Moyer
PublisherSPIE
Pages38-45
Number of pages8
ISBN (Print)0-8194-1894-3
DOIs
Publication statusPublished - 1995
EventSPIE's International Conference on Optical Science, Engineering, and Instrumentation 1995: Near-Field Optics - San Diego, United States
Duration: 9 Jul 199514 Jul 1995

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume2535

Conference

ConferenceSPIE's International Conference on Optical Science, Engineering, and Instrumentation 1995
CountryUnited States
CitySan Diego
Period9/07/9514/07/95

Fingerprint Dive into the research topics of 'Fluorescence scanning near-field optical microscopy in reflection'. Together they form a unique fingerprint.

  • Cite this

    Jalocha, A., Moers, M. H. P., & van Hulst, N. F. (1995). Fluorescence scanning near-field optical microscopy in reflection. In M. A. Paesler, & P. J. Moyer (Eds.), Near-Field Optics: SPIE's 1995 International Conference on Optical Science, Engineering, and Instrumentation, 9-14 July 1995 (pp. 38-45). (Proceedings of SPIE; Vol. 2535). SPIE. https://doi.org/10.1117/12.218694