Focused ion beam milling of three dimensional nanostructures with high precision

R.W. Tjerkstra, F.B. Segerink, J.J. Kelly, W.L. Vos

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

18 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Focused ion beam milling of three dimensional nanostructures with high precision'. Together they form a unique fingerprint.

Physics & Astronomy