Foreword

Marco Ottavi*, Said Hamdioui, Sandip Kundu, Salvatore Pontarelli

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings - 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Place of PublicationPiscataway, NJ
PublisherIEEE
Pagesii-iii
Number of pages2
ISBN (Electronic)978-1-4799-6155-9
DOIs
Publication statusPublished - 18 Nov 2014
Externally publishedYes
Event27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 - Amsterdam, Netherlands
Duration: 1 Oct 20143 Oct 2014

Publication series

NameProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)1550-5774

Conference

Conference27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014
Country/TerritoryNetherlands
CityAmsterdam
Period1/10/143/10/14

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