Foreword

Gianluca Furano; Marco Ottavi; Luigi Dilillo; Mihalis Psarakis

doi:10.1109/DFT50435.2020.9250791

Foreword

Gianluca Furano
, Marco Ottavi
, Luigi Dilillo
, Mihalis Psarakis

Research output: Chapter in Book/Report/Conference proceeding › Foreword/postscript › Academic

Abstract

Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

Original language	English
Title of host publication	33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Editors	Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua
Publisher	IEEE
Number of pages	2
DOIs	https://doi.org/10.1109/DFT50435.2020.9250791
Publication status	Published - 19 Oct 2020
Externally published	Yes
Event	33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020 - Virtual, Online, Italy Duration: 19 Oct 2020 → 21 Oct 2020 Conference number: 33

Conference

Conference	33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020
Abbreviated title	DFT 2020
Country/Territory	Italy
City	Virtual, Online
Period	19/10/20 → 21/10/20

Access to Document

10.1109/DFT50435.2020.9250791

Cite this

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title = "Foreword",

abstract = "Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.",

author = "Gianluca Furano and Marco Ottavi and Luigi Dilillo and Mihalis Psarakis",

year = "2020",

month = oct,

day = "19",

doi = "10.1109/DFT50435.2020.9250791",

language = "English",

editor = "Luigi Dilillo and Mihalis Psarakis and Taniya Siddiqua",

booktitle = "33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems",

publisher = "IEEE",

address = "United States",

note = "33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, DFT 2020 ; Conference date: 19-10-2020 Through 21-10-2020",

}

Furano, G, Ottavi, M, Dilillo, L & Psarakis, M 2020, Foreword. in L Dilillo, M Psarakis & T Siddiqua (eds), 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Virtual, Online, Italy, 19/10/20. https://doi.org/10.1109/DFT50435.2020.9250791

TY - CHAP

T1 - Foreword

AU - Furano, Gianluca

AU - Ottavi, Marco

AU - Dilillo, Luigi

AU - Psarakis, Mihalis

N1 - Conference code: 33

PY - 2020/10/19

Y1 - 2020/10/19

N2 - Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

AB - Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

UR - https://www.scopus.com/pages/publications/85097671382

U2 - 10.1109/DFT50435.2020.9250791

DO - 10.1109/DFT50435.2020.9250791

M3 - Foreword/postscript

AN - SCOPUS:85097671382

BT - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

A2 - Dilillo, Luigi

A2 - Psarakis, Mihalis

A2 - Siddiqua, Taniya

PB - IEEE

T2 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020

Y2 - 19 October 2020 through 21 October 2020

ER -

Foreword

Abstract

Conference

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