@inbook{8930b0beb5ba472fbb4de90d41d71c79,
title = "Foreword",
author = "Saqib Khursheed and Spyros Tragoudas and Marco Ottavi and Vilas Sridharan",
note = "Funding Information: The Symposium is sponsored by the IEEE Computer Society, IEEE Fault-Tolerant Computing Technical Committee and IEEE Test Technology Technical Council. Over the last 31 years, DFT has served as an international forum for research in the field of defect and fault tolerance in VLSI and nanotechnology systems with emerging technologies.; 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018 ; Conference date: 08-10-2018 Through 10-10-2018",
year = "2019",
month = jan,
day = "4",
doi = "10.1109/DFT.2018.8602980",
language = "English",
booktitle = "2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)",
publisher = "IEEE",
address = "United States",
}