From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores

Bruno Forlin*, Kevin Böhmer, Carlo Cazzaniga, Paolo Rech, Gianluca Furano, Nikolaos Alachiotis, Marco Ottavi

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Abstract

As traditional space-grade computing systems struggle to meet the increasing computational demands of modern space missions, RISC-V emerges as a promising alternative due to its open-source and highly customizable nature. However, the extensive hardware customization options in RISC-V introduce complexity in validation, making it challenging to ensure system reliability. This paper introduces a robust methodology for validating RISC-V-based systems under accelerated radiation beams, focusing on test uptime, leveraging Commercial Off-The-Shelf (COTS) FPGA devices, which offer flexibility and cost-effectiveness, to enable concurrent hardware and software development. We demonstrate how our methodology offers a comprehensive approach for testing heterogeneous systems on FPGAs, balancing thorough integration with cost-efficiency and test robustness. During our experiments with accelerated neutrons to assess the resilience of RISC-V cores, our approach guaranteed the correct delivery of 100% of the packages, while minimizing system downtime during radiation testing by reducing the Test Fixture SEFI cross-section.

Original languageEnglish
Pages (from-to)27-36
Number of pages10
JournalIEEE transactions on device and materials reliability
Volume25
Issue number1
DOIs
Publication statusPublished - 2025

Keywords

  • 2025 OA procedure
  • Flash-based FPGA
  • Radiation testing
  • RISC-V
  • Soft-core
  • Fault tolerance

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