TY - JOUR
T1 - From Ground to Orbit
T2 - A Robust and Efficient Test Methodology for RISC-V Soft-Cores
AU - Forlin, Bruno
AU - Böhmer, Kevin
AU - Cazzaniga, Carlo
AU - Rech, Paolo
AU - Furano, Gianluca
AU - Alachiotis, Nikolaos
AU - Ottavi, Marco
N1 - Publisher Copyright:
© 2001-2011 IEEE.
PY - 2025
Y1 - 2025
N2 - As traditional space-grade computing systems struggle to meet the increasing computational demands of modern space missions, RISC-V emerges as a promising alternative due to its open-source and highly customizable nature. However, the extensive hardware customization options in RISC-V introduce complexity in validation, making it challenging to ensure system reliability. This paper introduces a robust methodology for validating RISC-V-based systems under accelerated radiation beams, focusing on test uptime, leveraging Commercial Off-The-Shelf (COTS) FPGA devices, which offer flexibility and cost-effectiveness, to enable concurrent hardware and software development. We demonstrate how our methodology offers a comprehensive approach for testing heterogeneous systems on FPGAs, balancing thorough integration with cost-efficiency and test robustness. During our experiments with accelerated neutrons to assess the resilience of RISC-V cores, our approach guaranteed the correct delivery of 100% of the packages, while minimizing system downtime during radiation testing by reducing the Test Fixture SEFI cross-section.
AB - As traditional space-grade computing systems struggle to meet the increasing computational demands of modern space missions, RISC-V emerges as a promising alternative due to its open-source and highly customizable nature. However, the extensive hardware customization options in RISC-V introduce complexity in validation, making it challenging to ensure system reliability. This paper introduces a robust methodology for validating RISC-V-based systems under accelerated radiation beams, focusing on test uptime, leveraging Commercial Off-The-Shelf (COTS) FPGA devices, which offer flexibility and cost-effectiveness, to enable concurrent hardware and software development. We demonstrate how our methodology offers a comprehensive approach for testing heterogeneous systems on FPGAs, balancing thorough integration with cost-efficiency and test robustness. During our experiments with accelerated neutrons to assess the resilience of RISC-V cores, our approach guaranteed the correct delivery of 100% of the packages, while minimizing system downtime during radiation testing by reducing the Test Fixture SEFI cross-section.
KW - 2025 OA procedure
KW - Flash-based FPGA
KW - Radiation testing
KW - RISC-V
KW - Soft-core
KW - Fault tolerance
UR - http://www.scopus.com/inward/record.url?scp=105001209343&partnerID=8YFLogxK
U2 - 10.1109/TDMR.2025.3537718
DO - 10.1109/TDMR.2025.3537718
M3 - Article
AN - SCOPUS:105001209343
SN - 1530-4388
VL - 25
SP - 27
EP - 36
JO - IEEE transactions on device and materials reliability
JF - IEEE transactions on device and materials reliability
IS - 1
ER -