From nationwide point clouds to nationwide 3D landscape models

G. Vosselman, S.J. Oude Elberink, Marc Post, Jantien Stoter, Biao Xiong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Original language	English
Title of host publication	Proceedings of Photogrammetric Week '15, 7-11 September, Stuttgart, Germany
Editors	D. Frietsch
Place of Publication	Berlin
Publisher	Wichmann
Pages	247-256
Number of pages	10
ISBN (Print)	978-3-87907-587-4
Publication status	Published - 7 Sept 2015
Event	Photogrammetric Week '15 - Stuttgart, Germany Duration: 7 Sept 2015 → 11 Sept 2015

Access to Document

@inproceedings{410d3179ed5e4553abd98262cdac6969,

title = "From nationwide point clouds to nationwide 3D landscape models",

author = "G. Vosselman and {Oude Elberink}, S.J. and Marc Post and Jantien Stoter and Biao Xiong",

year = "2015",

month = sep,

day = "7",

language = "English",

isbn = "978-3-87907-587-4",

pages = "247--256",

editor = "D. Frietsch",

booktitle = "Proceedings of Photogrammetric Week '15, 7-11 September, Stuttgart, Germany",

publisher = "Wichmann",

note = "Photogrammetric Week '15 ; Conference date: 07-09-2015 Through 11-09-2015",

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Vosselman, G , Oude Elberink, SJ, Post, M, Stoter, J & Xiong, B 2015, From nationwide point clouds to nationwide 3D landscape models. in D Frietsch (ed.), Proceedings of Photogrammetric Week '15, 7-11 September, Stuttgart, Germany. Wichmann, Berlin, pp. 247-256, Photogrammetric Week '15, Stuttgart, Germany, 7/09/15. <https://phowo.ifp.uni-stuttgart.de/publications/phowo15/250Vosselman.pdf>

TY - GEN

T1 - From nationwide point clouds to nationwide 3D landscape models

AU - Vosselman, G.

AU - Oude Elberink, S.J.

AU - Post, Marc

AU - Stoter, Jantien

AU - Xiong, Biao

PY - 2015/9/7

Y1 - 2015/9/7

M3 - Conference contribution

SN - 978-3-87907-587-4

SP - 247

EP - 256

BT - Proceedings of Photogrammetric Week '15, 7-11 September, Stuttgart, Germany

A2 - Frietsch, D.

PB - Wichmann

CY - Berlin

T2 - Photogrammetric Week '15

Y2 - 7 September 2015 through 11 September 2015

ER -