Full microscopic treatment of the optical response of the Si(100)2x1 surface

C.M.J. Wijers, G.P.M. Poppe, P.L. de Boeij, H.G. Bekker, D.J. Wentink

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Abstract

The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).
Original languageEnglish
Pages (from-to)28-31
Number of pages4
JournalThin solid films
Volume233
Issue number1-2
DOIs
Publication statusPublished - 1993
Event1st International Conference on Spectroscopic Ellipsometry, ICSE 1993 - Paris, France
Duration: 11 Jan 199314 Jan 1993
Conference number: 1

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