The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).
|Number of pages||4|
|Journal||Thin solid films|
|Publication status||Published - 1993|
|Event||1st International Conference on Spectroscopic Ellipsometry, ICSE 1993 - Paris, France|
Duration: 11 Jan 1993 → 14 Jan 1993
Conference number: 1