Full microscopic treatment of the optical response of the Si(100)2x1 surface

C.M.J. Wijers; G.P.M. Poppe; P.L. de Boeij; H.G. Bekker; D.J. Wentink

doi:10.1016/0040-6090(93)90055-T

Full microscopic treatment of the optical response of the Si(100)2x1 surface

C.M.J. Wijers, G.P.M. Poppe, P.L. de Boeij, H.G. Bekker, D.J. Wentink

Physics of Interfaces and Nanomaterials

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).

Original language	English
Pages (from-to)	28-31
Number of pages	4
Journal	Thin solid films
Volume	233
Issue number	1-2
DOIs	https://doi.org/10.1016/0040-6090(93)90055-T
Publication status	Published - 1993
Event	1st International Conference on Spectroscopic Ellipsometry, ICSE 1993 - Paris, France Duration: 11 Jan 1993 → 14 Jan 1993 Conference number: 1

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@article{6e1aa246a6eb451d8a6fc0df25cef84f,

title = "Full microscopic treatment of the optical response of the Si(100)2x1 surface",

abstract = "The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).",

author = "C.M.J. Wijers and G.P.M. Poppe and {de Boeij}, P.L. and H.G. Bekker and D.J. Wentink",

year = "1993",

doi = "10.1016/0040-6090(93)90055-T",

language = "English",

volume = "233",

pages = "28--31",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

note = "1st International Conference on Spectroscopic Ellipsometry, ICSE 1993, ICSE ; Conference date: 11-01-1993 Through 14-01-1993",

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T1 - Full microscopic treatment of the optical response of the Si(100)2x1 surface

AU - Wijers, C.M.J.

AU - Poppe, G.P.M.

AU - de Boeij, P.L.

AU - Bekker, H.G.

AU - Wentink, D.J.

N1 - Conference code: 1

PY - 1993

Y1 - 1993

N2 - The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).

AB - The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).

U2 - 10.1016/0040-6090(93)90055-T

DO - 10.1016/0040-6090(93)90055-T

M3 - Article

SN - 0040-6090

VL - 233

SP - 28

EP - 31

JO - Thin solid films

JF - Thin solid films

IS - 1-2

T2 - 1st International Conference on Spectroscopic Ellipsometry, ICSE 1993

Y2 - 11 January 1993 through 14 January 1993

ER -

Full microscopic treatment of the optical response of the Si(100)2x1 surface

Abstract

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