Full Scan Testing of Ansynchronous Circuits

F.J. te Beest, R.J.W.T. Tangelder, K. van Berkel, A. Peeters

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Prorisc Workshop
    Place of PublicationVeldhoven, The Netherlands
    Pages223-228
    Publication statusPublished - 30 Nov 2000

    Keywords

    • METIS-113031

    Cite this

    te Beest, F. J., Tangelder, R. J. W. T., van Berkel, K., & Peeters, A. (2000). Full Scan Testing of Ansynchronous Circuits. In Proceedings of the Prorisc Workshop (pp. 223-228). Veldhoven, The Netherlands.