Full Scan Testing of Ansynchronous Circuits

F.J. te Beest, R.J.W.T. Tangelder, K. van Berkel, A. Peeters

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the Prorisc Workshop
Place of Publication	Veldhoven, The Netherlands
Pages	223-228
Publication status	Published - 30 Nov 2000

Keywords

@inproceedings{00f5f03baaad46838753dfd17286440c,

title = "Full Scan Testing of Ansynchronous Circuits",

keywords = "METIS-113031",

author = "\{te Beest\}, F.J. and R.J.W.T. Tangelder and \{van Berkel\}, K. and A. Peeters",

year = "2000",

month = nov,

day = "30",

language = "Undefined",

isbn = "9073461243",

pages = "223--228",

booktitle = "Proceedings of the Prorisc Workshop",

}