Full scan testing of handshake circuits

F.J. te Beest

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    27 Downloads (Pure)
    Original languageUndefined
    Supervisors/Advisors
    • Krol, Th., Supervisor
    • van Berkel, C.H., Supervisor
    • Kerkhoff, Hans Gerard, Advisor
    Award date21 May 2003
    Place of PublicationEnschede, The Netherlands
    Publisher
    Print ISBNs9036519098
    Publication statusPublished - 21 May 2003

    Keywords

    • METIS-211760
    • IR-38651

    Cite this

    te Beest, F. J. (2003). Full scan testing of handshake circuits. Enschede, The Netherlands: Twente University Press (TUP).