Full scan testing of handshake circuits

F.J. te Beest

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    17 Downloads (Pure)
    Original languageUndefined
    Supervisors/Advisors
    • Krol, Th., Supervisor
    • van Berkel, C.H., Supervisor
    • Kerkhoff, Hans Gerard, Advisor
    Award date21 May 2003
    Place of PublicationEnschede, The Netherlands
    Publisher
    Print ISBNs9036519098
    Publication statusPublished - 21 May 2003

    Keywords

    • METIS-211760
    • IR-38651

    Cite this

    te Beest, F. J. (2003). Full scan testing of handshake circuits. Enschede, The Netherlands: Twente University Press (TUP).
    te Beest, F.J.. / Full scan testing of handshake circuits. Enschede, The Netherlands : Twente University Press (TUP), 2003. 150 p.
    @phdthesis{765a12b313fa4be19b063a0bf2757cf7,
    title = "Full scan testing of handshake circuits",
    keywords = "METIS-211760, IR-38651",
    author = "{te Beest}, F.J.",
    year = "2003",
    month = "5",
    day = "21",
    language = "Undefined",
    isbn = "9036519098",
    publisher = "Twente University Press (TUP)",
    address = "Netherlands",

    }

    te Beest, FJ 2003, 'Full scan testing of handshake circuits', Enschede, The Netherlands.

    Full scan testing of handshake circuits. / te Beest, F.J.

    Enschede, The Netherlands : Twente University Press (TUP), 2003. 150 p.

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    TY - THES

    T1 - Full scan testing of handshake circuits

    AU - te Beest, F.J.

    PY - 2003/5/21

    Y1 - 2003/5/21

    KW - METIS-211760

    KW - IR-38651

    M3 - PhD Thesis - Research UT, graduation UT

    SN - 9036519098

    PB - Twente University Press (TUP)

    CY - Enschede, The Netherlands

    ER -

    te Beest FJ. Full scan testing of handshake circuits. Enschede, The Netherlands: Twente University Press (TUP), 2003. 150 p.