Abstract
The invention relates to a functional unit for a processor, such as a Very
Large Instruction Word Processor. The invention further relates to a processor
comprising at least one such functional unit. The invention further relates to a
functional unit and processor capable of mitigating the effect of transient faults in
harsh environments.
Original language | Undefined |
---|---|
Patent number | EP13191370.9 |
Priority date | 4/11/13 |
Publication status | Submitted - 4 Nov 2013 |
Keywords
- METIS-300229
- CAES-TDT: Testable Design and Test
- EWI-24125