Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects

Yean Sheng Yong, S. Aravazhi, Sergio Andrés Vázquez-Córdova, Sonia Maria García Blanco, Markus Pollnau

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationIEEE Photonics Society Benelux Chapter
Place of PublicationEnschede
Pages59-62
Publication statusPublished - 3 Nov 2014
Event19th Annual Symposium of the IEEE Photonics Benelux Chapter 2014 - University of Twente, Enschede, Netherlands
Duration: 3 Nov 20144 Nov 2014
Conference number: 19
http://www.photonics-benelux.org/symp14/

Conference

Conference19th Annual Symposium of the IEEE Photonics Benelux Chapter 2014
CountryNetherlands
CityEnschede
Period3/11/144/11/14
Internet address

Keywords

  • METIS-307798

Cite this

Yong, Y. S., Aravazhi, S., Vázquez-Córdova, S. A., García Blanco, S. M., & Pollnau, M. (2014). Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects. In IEEE Photonics Society Benelux Chapter (pp. 59-62). Enschede.
Yong, Yean Sheng ; Aravazhi, S. ; Vázquez-Córdova, Sergio Andrés ; García Blanco, Sonia Maria ; Pollnau, Markus. / Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects. IEEE Photonics Society Benelux Chapter. Enschede, 2014. pp. 59-62
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title = "Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. {\%} ytterbium concentration for optical interconnects",
keywords = "METIS-307798",
author = "Yong, {Yean Sheng} and S. Aravazhi and V{\'a}zquez-C{\'o}rdova, {Sergio Andr{\'e}s} and {Garc{\'i}a Blanco}, {Sonia Maria} and Markus Pollnau",
year = "2014",
month = "11",
day = "3",
language = "English",
isbn = "978-90-365-3778-0",
pages = "59--62",
booktitle = "IEEE Photonics Society Benelux Chapter",

}

Yong, YS, Aravazhi, S, Vázquez-Córdova, SA, García Blanco, SM & Pollnau, M 2014, Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects. in IEEE Photonics Society Benelux Chapter. Enschede, pp. 59-62, 19th Annual Symposium of the IEEE Photonics Benelux Chapter 2014, Enschede, Netherlands, 3/11/14.

Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects. / Yong, Yean Sheng; Aravazhi, S.; Vázquez-Córdova, Sergio Andrés; García Blanco, Sonia Maria; Pollnau, Markus.

IEEE Photonics Society Benelux Chapter. Enschede, 2014. p. 59-62.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects

AU - Yong, Yean Sheng

AU - Aravazhi, S.

AU - Vázquez-Córdova, Sergio Andrés

AU - García Blanco, Sonia Maria

AU - Pollnau, Markus

PY - 2014/11/3

Y1 - 2014/11/3

KW - METIS-307798

M3 - Conference contribution

SN - 978-90-365-3778-0

SP - 59

EP - 62

BT - IEEE Photonics Society Benelux Chapter

CY - Enschede

ER -

Yong YS, Aravazhi S, Vázquez-Córdova SA, García Blanco SM, Pollnau M. Gain characterization of lattice-engineered potassium double tungstate thin film with 57.5 at. % ytterbium concentration for optical interconnects. In IEEE Photonics Society Benelux Chapter. Enschede. 2014. p. 59-62