Abstract
We report on an study of the GaP/Si interface for application in silicon heterojunction solar cells. We analyzed the band alignment using X-ray photoelectron spectroscopy (XPS) and cross-sectional Kelvin probe force microscopy (x-KPFM). Our measurements show a high conduction band offset (0.9 eV) leading to a barrier in electron extraction which we microscopically resolved via x-KPFM. XPS reveals the presence of Si-Ga bonds which explains the observed interface dipole that leads to low open circuit voltage and low fill factor in GaP/Si heterojunction solar cells. Furthermore, we investigated the electronic and morphologic changes in GaP upon Si and Mg doping.
Original language | English |
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Title of host publication | 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) |
Subtitle of host publication | (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) |
Publisher | IEEE |
Pages | 64-69 |
Number of pages | 6 |
ISBN (Electronic) | 978-1-5386-8529-7 |
DOIs | |
Publication status | Published - Aug 2018 |
Externally published | Yes |
Event | 45th IEEE Photovoltaic Specialists Conference, PVSC 2018 - Hilton Waikoloa Village Resort, Waikoloa Village, United States Duration: 10 Jun 2018 → 15 Jun 2018 Conference number: 45 http://www.ieee-pvsc.org/WCPEC-7/ |
Conference
Conference | 45th IEEE Photovoltaic Specialists Conference, PVSC 2018 |
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Abbreviated title | PVSC |
Country/Territory | United States |
City | Waikoloa Village |
Period | 10/06/18 → 15/06/18 |
Internet address |
Keywords
- Gallium Phosphide
- Silicon heterojunction
- band alignment
- doping
- morphology