Gate-Capacitance Extraction from RF C-V Measurements

G.T. Sasse, R. de Kort, Jurriaan Schmitz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	Proceedings of Semiconductor Advances for Future Electronics (SAFE)
Place of Publication	Veldhoven, The Netherlands
Publisher	STW
Publication status	Published - 25 Nov 2004
Event	Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 2004 - Veldhoven, Netherlands Duration: 25 Nov 2004 → 26 Nov 2004

Workshop	Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 2004
Abbreviated title	SAFE
Country/Territory	Netherlands
City	Veldhoven
Period	25/11/04 → 26/11/04

Keywords

@inproceedings{a679a992c804499fad4b9e4ddf7bff71,

title = "Gate-Capacitance Extraction from RF C-V Measurements",

keywords = "METIS-219037",

author = "G.T. Sasse and {de Kort}, R. and Jurriaan Schmitz",

year = "2004",

month = nov,

day = "25",

language = "English",

booktitle = "Proceedings of Semiconductor Advances for Future Electronics (SAFE)",

publisher = "STW",

note = "Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 2004, SAFE ; Conference date: 25-11-2004 Through 26-11-2004",

}

TY - GEN

T1 - Gate-Capacitance Extraction from RF C-V Measurements

AU - Sasse, G.T.

AU - de Kort, R.

AU - Schmitz, Jurriaan

PY - 2004/11/25

Y1 - 2004/11/25

KW - METIS-219037

M3 - Conference contribution

BT - Proceedings of Semiconductor Advances for Future Electronics (SAFE)

PB - STW

CY - Veldhoven, The Netherlands

T2 - Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 2004

Y2 - 25 November 2004 through 26 November 2004

ER -