Gate-Capacitance Extraction from RF C-V Measurements

G.T. Sasse, R. de Kort, Jurriaan Schmitz

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Original languageEnglish
    Title of host publicationProceedings of Semiconductor Advances for Future Electronics (SAFE)
    Place of PublicationVeldhoven, The Netherlands
    PublisherSTW
    Publication statusPublished - 25 Nov 2004
    EventAnnual Workshop on Semiconductor Advances for Future Electronics, SAFE 2004 - Veldhoven, Netherlands
    Duration: 25 Nov 200426 Nov 2004

    Workshop

    WorkshopAnnual Workshop on Semiconductor Advances for Future Electronics, SAFE 2004
    Abbreviated titleSAFE
    CountryNetherlands
    CityVeldhoven
    Period25/11/0426/11/04

    Keywords

    • METIS-219037

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