Gate Delay Fault Test Generation for Non-Scan Circuits

G. van Brakel, G. van Brakel, U. Gläser, Hans G. Kerkhoff, H.T. Vierhaus

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)
    94 Downloads (Pure)

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