Gate-Level Test Implementation for Optimal Area/Throughput/Test in VLIW TTA Architectures

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{f08ebfb06be2473c92fca535a8d88bf6,

title = "Gate-Level Test Implementation for Optimal Area/Throughput/Test in VLIW TTA Architectures",

keywords = "METIS-113008",

author = "V. Zivkovic and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",

year = "2000",

month = nov,

day = "30",

language = "Undefined",

isbn = "9073461243",

pages = "595--601",

booktitle = "Proceedings of Prorisc 2000",

}